Estimating the thickness of ultra thin sections for electron microscopy by image statistics
Research output: Chapter in Book/Report/Conference proceeding › Article in proceedings › Research › peer-review
We propose a method for estimating the thickness of ultra thin histological sections by image statistics alone. Our method works for images, that are the realisations of a stationary and isotropic stochastic process, and it relies on the existence of statistical image-measures that are strictly monotonic with distance. We propose to use the standard deviation of the difference between pixel values as a function of distance, and we give an extremely simple, linear algorithm. Our algorithm is applied to the challenging domain of electron microscopic sections supposedly $45\text{ nm}$ apart, and we show that these images with high certainty belong to the required statistical class, and that the reconstructions are valid.
Original language | English |
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Title of host publication | 2014 IEEE International Symposium on Biomedical Imaging |
Number of pages | 4 |
Publisher | IEEE |
Publication date | 2014 |
Pages | 157-160 |
ISBN (Electronic) | 978-1-4673-1959-1 |
DOIs | |
Publication status | Published - 2014 |
Event | International Symposium on Biomedical Imaging - Beijing, China Duration: 28 Apr 2014 → 2 May 2014 |
Conference
Conference | International Symposium on Biomedical Imaging |
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Land | China |
By | Beijing |
Periode | 28/04/2014 → 02/05/2014 |
ID: 161621598